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Characterization (materials science)

Study of material structure and properties

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  • 3 chapters

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Through Electron microscope, Microscopy and Photon

While many characterization techniques have been practiced for centuries, such as basic optical microscopy, new techniques and methodologies are constantly emerging. In particular the advent of the electron microscope and secondary ion mass spectrometry in the 20th century has revolutionized the field, allowing the imaging and analysis of structures and compositions on much smaller scales than was previously possible, leading to a huge increase in the level of understanding as to why different materials show different properties and behaviors. More recently, atomic force microscopy has further increased the maximum possible resolution for analysis of certain samples in the last 30 years.

Microscopy

Microscopy is a category of characterization techniques which probe and map the surface and sub-surface structure of a material. These techniques can use photons, electrons, ions or physical cantilever probes to gather data about a sample's structure on a range of length scales. Some common examples of microscopy techniques include:

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