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Principal curvature-based region detector

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Through Feature (computer vision) and Computer vision

Local region detectors can typically be classified into two categories: intensity-based detectors and structure-based detectors.

  • Intensity-based detectors depend on analyzing local differential geometry or intensity patterns to find points or regions that satisfy some uniqueness and stability criteria. These detectors include SIFT, Hessian-affine, Harris-Affine and MSER etc.
  • Structure-based detectors depend on structural image features such as lines, edges, curves, etc. to define interest points or regions. These detectors include edge-based region (EBR) and scale-invariant shape features (SISF)

From the detection invariance point of view, feature detectors can be divided into fixed scale detectors such as normal Harris corner detector, scale invariant detectors such as SIFT and affine invariant detectors such as Hessian-affine.

The PCBR detector is a structure-based affine-invariant detector.

Why a new detector?

In many object recognition tasks, within-class changes in pose, lighting, color, and texture can cause considerable variation in local intensities. Consequently, local intensity no longer provides a stable detection cue. As such, intensity-based interest operators (e.g., SIFT, Harris-Affine)–and the object recognition systems based on them–often fail to identify discriminative features. An alternative to local intensity cues is to capture semi-local structural cues such as edges and curvilinear shapes. These structural cues tend to be more robust to intensity, color, and pose variations. As such, they provide the basis for a more stable interest operator, which in turn improves object recognition accuracy. PCBR detector was developed to exploit these more reliable image structural cues.

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