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Gallium nitride

Chemical semiconductor compound

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GaN Wurtzite crystal structure
https://commons.wikimedia.org/wiki/User:Solid_State · CC BY-SA 4.0

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Through Nitrogen, Semiconductor and Solar cell

Its sensitivity to ionizing radiation is low (like other group III nitrides), making it a suitable material for solar cell arrays for satellites. Military and space applications could also benefit as devices have shown stability in high-radiation environments.

Because GaN transistors can operate at much higher temperatures and work at much higher voltages than gallium arsenide (GaAs) transistors, they make ideal power amplifiers at microwave frequencies. In addition, GaN offers promising characteristics for THz devices. Due to high power density and voltage breakdown limits GaN is also emerging as a promising candidate for 5G cellular base station applications. Since the early 2020s, GaN power transistors have come into increasing use in power supplies in electronic equipment, converting AC mains electricity to low-voltage DC, as well as higher-voltage applications such as electric vehicle traction inverters due to their small size, fast switching speed and high efficiency.

Physical properties

GaN is a very hard (Knoop hardness 14.21 GPa), mechanically stable wide-bandgap semiconductor material with high heat capacity and thermal conductivity. In its pure form it resists cracking and can be deposited in thin film on sapphire or silicon carbide, despite the mismatch in their lattice constants. GaN can be doped with silicon (Si) or with oxygen to n-type and with magnesium (Mg) to p-type. However, the Si and Mg atoms change the way the GaN crystals grow, introducing tensile stresses and making them brittle. Gallium nitride compounds also tend to have a high dislocation density, on the order of 108 to 1010 defects per square centimeter.

The U.S. Army Research Laboratory (ARL) provided the first measurement of the high field electron velocity in GaN in 1999. Scientists at ARL experimentally obtained a peak steady-state velocity of 1.9×107 cm/s, with a transit time of 2.5 picoseconds, attained at an electric field of 225 kV/cm. With this information, the electron mobility was calculated, thus providing data for the design of GaN devices.

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